Path:OKDatasheet > Semiconductor Datasheet > TI Datasheet > SN74F112D
SN74F112D spec: DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOP WITH CLEAR AND PRESET
SN74F112D Lignende
- SN74BCT8374ADWR
- SCAN TEST DEVICE WITH OCTAL D-TYPE EDGE-TRIGGERED FLIP-FLOPS
- SN74ABT623N
- OCTAL BUS TRANSCEIVERS WITH 3-STATE OUTPUTS
- SN74AHC541PWR
- OCTAL BUFFERS/DRIVERS WITH 3-STATE OUTPUTS
- SN74S260D
- DUAL 5-INPUT POSITIVE-NOR GATES
- SN74LVTH16652DLR
- 3.3 V ABT 16-BIT BUS TRANSCEIVERS AND REGISTERS WITH 3-STATE OUTPUTS
- SN7405N3
- HEX INVERTERS WITH OPEN COLLECTOR OUTPUTS
- SN74AHC74PWLE
- DUAL POSITIVE-EDGE-TRIGGERED D-TYPE FLIP-FLOPS WITH CLEAR AND PRESET
- SN74HC02DBR
- QUADRUPLE 2-INPUT POSITIVE-NOR GATES
SN74F112D Datasheet og Spec
Produsent : TI
Emballasje :
Pins : 16
Temperatur : Min 0 °C | Max 70 °C
Størrelse : 80 KB
Applikasjon : DUAL J-K NEGATIVE-EDGE-TRIGGERED FLIP-FLOP WITH CLEAR AND PRESET
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